State Key Lab of Inorganic Synthesis & Preparative Chemistry,Jilin University » Facilities - 半岛官网PG https://synlab.www.hogge1.com/en/ Fri, 30 May 2025 06:20:34 +0000 en-US hourly 1 Capable and Highest Accuracy Drop Calorimetry Analyzer https://synlab.www.hogge1.com/en/2024/01/5075.html https://synlab.www.hogge1.com/en/2024/01/5075.html#comments Fri, 05 Jan 2024 10:13:31 +0000 Zhibin Geng https://synlab.www.hogge1.com/2024/01/5075.html

Model

CALVET DC Alexsys

Manufacturer

Setaram KEP Technologies

Purchase Date

2024

Specifications

Temp: 500°C-1000°C, Temp accuracy: ±0.4%, Sensor type: Calvet 3D thermocouple pile, Calorimetric accuracy: ±1%, Calorimetric resolution: 12.5 µW, Calorimetry method: Drop method, Sample placement: Top-loaded, bottom-drop.

Capable and Highest Accuracy Drop Calorimetry Analyzer

]]> https://synlab.www.hogge1.com/en/2024/01/5075.html/feed 0 Turn-Key XAFS and XES https://synlab.www.hogge1.com/en/2023/09/5077.html https://synlab.www.hogge1.com/en/2023/09/5077.html#comments Tue, 05 Sep 2023 10:27:45 +0000 Zhibin Geng https://synlab.www.hogge1.com/2023/09/5077.html

Model

easyXAFS300+

Manufacturer

easyXAFS inc,US

Purchase Date

2023

mytab

Energy: 5-12keV/Max 19keV, XAFS resolution: 0.5-1.5eV (7-9keV), XES resolution: 1.0-1.5eV (7-9keV), Repeatability: <50 meV, Luminous flux: 300,000 -500,000 photons/sec.(7-9 keV)

Turn-Key XAFS and XES

]]> https://synlab.www.hogge1.com/en/2023/09/5077.html/feed 0 Transmission Electron Microscope(Talos F200S G2) https://synlab.www.hogge1.com/en/2023/01/450.html https://synlab.www.hogge1.com/en/2023/01/450.html#comments Mon, 30 Jan 2023 08:41:00 +0000 Chunguang Li http://synlab.www.hogge1.com/?p=450

Model

Talos F200S G2

Manufacturer

Thermo Fisher Scientific Inc, Czech

Purchase Date

2023

Specifications

Accelerating Voltage: 200 kV; point resolution: 0.25 nm; Information resolution: 0.12 nm; STEM HAADF resolution: 0.16 nm; EDS energy resolution: 136 ev; Element detection range: B～U

Field Emission Transmission Electron Microscope

]]> https://synlab.www.hogge1.com/en/2023/01/450.html/feed 0 Low-Temperature Scanning Tunneling Microscope System https://synlab.www.hogge1.com/en/2022/09/5068.html https://synlab.www.hogge1.com/en/2022/09/5068.html#comments Mon, 05 Sep 2022 08:00:07 +0000 Yue Song https://synlab.www.hogge1.com/2022/09/5068.html

Model

customized LT-STM system

Manufacturer

Scienta Omicron GmbH

Purchase Date

2018

Specifications

STM: Atomic resolution on Au(110), AFM: Atomic resolution on NaCl(111). Tunneling current <1pA-300nA. Main applications: STM testing, Q-Plus testing, sample preparation (cutting, annealing, plasma cleaning, etc.)

Low-Temperature Scanning Tunneling Microscope System

]]> https://synlab.www.hogge1.com/en/2022/09/5068.html/feed 0 D8 Advance X-Ray Diffractometer https://synlab.www.hogge1.com/en/2019/07/4790.html https://synlab.www.hogge1.com/en/2019/07/4790.html#comments Wed, 17 Jul 2019 03:25:25 +0000 Yan Yan https://synlab.www.hogge1.com/2019/07/4790.html

Model

D8 Advance

Manufacturer

Bruker inc,USA

Purchase Date

2019

Specifications

Cu；2.2kW；Theta/Theta Vertical Goniometer；LYNXEYE XE detector

D8 Advance X-Ray Diffractometer

]]> https://synlab.www.hogge1.com/en/2019/07/4790.html/feed 0 Bruker Avance Neo 600WB Spectrometer https://synlab.www.hogge1.com/en/2019/07/4776.html https://synlab.www.hogge1.com/en/2019/07/4776.html#comments Sun, 14 Jul 2019 08:59:33 +0000 Yongcun Zou https://synlab.www.hogge1.com/2019/07/4776.html

Model

Avance Neo 600WB

Manufacturer

Bruker inc,USA

Purchase Date

2019

Specifications

Magnetic field strength of magnet: 14.09 Tesla; Frequency resolution: ≤ 0.005Hz; Phase resolution: ≤ 0.006 degrees; Maximum spectral width: ≥ 7.5 MHz

Bruker Avance Neo 600WB spectrometer

]]> https://synlab.www.hogge1.com/en/2019/07/4776.html/feed 0 VERTEX 80v Vacuum FT-IR Spectrometer https://synlab.www.hogge1.com/en/2018/11/4782.html https://synlab.www.hogge1.com/en/2018/11/4782.html#comments Wed, 14 Nov 2018 09:54:14 +0000 Yanan Guo https://synlab.www.hogge1.com/2018/11/4782.html

Model

VERTEX 80v

Manufacturer

Bruker inc,USA

Purchase Date

2018

Specifications

DTGS detector scanning range: 400-4000 cm-1. Liquid nitrogen-cooled MCT detector scanning range: 600-4000 cm-1. ATR reflection testing and in-situ infrared diffuse reflection testing.

VERTEX 80v

]]> https://synlab.www.hogge1.com/en/2018/11/4782.html/feed 0 LAMBDA 950 UV/Vis/NIR Spectrophotometer https://synlab.www.hogge1.com/en/2018/09/4785.html https://synlab.www.hogge1.com/en/2018/09/4785.html#comments Fri, 14 Sep 2018 10:10:41 +0000 Yanan Guo https://synlab.www.hogge1.com/2018/09/4785.html

Model

LAMBDA 950S

Manufacturer

PerkinELmer Inc.,USA

Purchase Date

2018

Specifications

Light source: Deuterium lamp and tungsten lamp. Measurement range: Standard detector 190-3300 nm; liquid and thin film samples, integrating sphere detector 200-2500 nm; liquid, thin film, and powder samples.

LAMBDA 950 UV/Vis/NIR Spectrophotometer

]]> https://synlab.www.hogge1.com/en/2018/09/4785.html/feed 0 Field Emission Scanning Electron Microscope(JSM-7800F) https://synlab.www.hogge1.com/en/2018/07/4779.html https://synlab.www.hogge1.com/en/2018/07/4779.html#comments Sat, 14 Jul 2018 09:30:13 +0000 Yuan Zhang https://synlab.www.hogge1.com/2018/07/4779.html

Model

JSM-7800F

Manufacturer

JEOL Ltd, Japan

Purchase Date

2018

Specifications

Resolution: 0.8 nm (15 kV), 1.2 nm (1 kV), Secondary electron image, Backscattered electron image, Acceleration voltage: 0.01 kV-30 kV, Probe current: pA-200nA, Magnification: ×25-×1000000

JSM-7800F

]]> https://synlab.www.hogge1.com/en/2018/07/4779.html/feed 0 D8 Venture X-Ray Single Crystal Diffractometer https://synlab.www.hogge1.com/en/2018/07/3635.html https://synlab.www.hogge1.com/en/2018/07/3635.html#comments Thu, 05 Jul 2018 04:32:16 +0000 Jia Hua http://synlab.www.hogge1.com/2018/07/3635.html

Model

D8 Venture

Manufacturer

Bruker inc,USA

Purchase Date

2018

Specifications

High Voltage:50kv,Electric Current:50mA,IµS 3.0 microfocus X-ray source,Low Temperature devices

D8 Venture X-Ray Single Crystal Diffractometer

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