State Key Lab of Inorganic Synthesis & Preparative Chemistry,Jilin University » Electron Microscope - 半岛官网PG https://synlab.www.hogge1.com/en/ Fri, 06 Jun 2025 00:54:26 +0000 en-US hourly 1 Transmission Electron Microscope(Talos F200S G2) https://synlab.www.hogge1.com/en/2023/01/450.html https://synlab.www.hogge1.com/en/2023/01/450.html#comments Mon, 30 Jan 2023 08:41:00 +0000 Chunguang Li http://synlab.www.hogge1.com/?p=450

Model

Talos F200S G2

Manufacturer

Thermo Fisher Scientific Inc, Czech

Purchase Date

2023

Specifications

Accelerating Voltage: 200 kV; point resolution: 0.25 nm; Information resolution: 0.12 nm; STEM HAADF resolution: 0.16 nm; EDS energy resolution: 136 ev; Element detection range: B~U

Field Emission Transmission Electron Microscope

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Low-Temperature Scanning Tunneling Microscope System https://synlab.www.hogge1.com/en/2022/09/5068.html https://synlab.www.hogge1.com/en/2022/09/5068.html#comments Mon, 05 Sep 2022 08:00:07 +0000 Yue Song https://synlab.www.hogge1.com/2022/09/5068.html

Model

customized LT-STM system

Manufacturer

Scienta Omicron GmbH

Purchase Date

2018

Specifications

STM: Atomic resolution on Au(110), AFM: Atomic resolution on NaCl(111). Tunneling current <1pA-300nA. Main applications: STM testing, Q-Plus testing, sample preparation (cutting, annealing, plasma cleaning, etc.)

Low-Temperature Scanning Tunneling Microscope System

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Field Emission Scanning Electron Microscope(JSM-7800F) https://synlab.www.hogge1.com/en/2018/07/4779.html https://synlab.www.hogge1.com/en/2018/07/4779.html#comments Sat, 14 Jul 2018 09:30:13 +0000 Yuan Zhang https://synlab.www.hogge1.com/2018/07/4779.html

Model

JSM-7800F

Manufacturer

JEOL Ltd, Japan

Purchase Date

2018

Specifications

Resolution: 0.8 nm (15 kV), 1.2 nm (1 kV), Secondary electron image, Backscattered electron image, Acceleration voltage: 0.01 kV-30 kV, Probe current: pA-200nA, Magnification: ×25-×1000000

JSM-7800F

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Applications of Electron Microscopy https://synlab.www.hogge1.com/en/2013/10/942.html https://synlab.www.hogge1.com/en/2013/10/942.html#comments Thu, 24 Oct 2013 14:20:12 +0000 Jia Hua http://synlab.www.hogge1.com/?p=942 Applications of Electron Microscopy

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200KV Transmission Electron Microscope https://synlab.www.hogge1.com/en/2012/10/322.html https://synlab.www.hogge1.com/en/2012/10/322.html#comments Sun, 29 Sep 2013 10:05:45 +0000 Chunguang Li http://synlab.www.hogge1.com/?p=322

Model

Tecnai G2 S-Twin F20

Manufacturer

FEI inc,USA

Purchase Date

2010

Specifications

Point Resolution:0.24nm,High Resolution STEM:0.2nm,Lens focal length:1.7mm,Maximum angle:±40°

200KV Transmission Electron Microscope

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Scanning Electron Microscopy(JSM-6700F) https://synlab.www.hogge1.com/en/2004/09/454.html https://synlab.www.hogge1.com/en/2004/09/454.html#comments Mon, 30 Sep 2013 09:06:13 +0000 Yuan Zhang

Model

JSM-6700F

Manufacturer

JEOL inc,Japan

Purchase Date

2004

Specifications

Point Resolution:1.0nm,Accelerating Voltage:30kv

Scanning Electron Microscopy

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